Australia & New Zealand (03) 9540 5100

New Product Release in Non-Contact Displacement Sensor Portfolio

Bestech Australia supplies high-precision sensors from Micro-Epsilon for automation, additive manufacturing and high-volume manufacturing applications in Australia and New Zealand. We are proud to announce the addition of new products, including ultra-high precision interferometer systems and large measuring range laser triangulation sensors, opening a unique breadth of applications for nanotechnology, robotics, and production line environments.

The new ILD 1910-500 and ILD1910-750 can measure up to a maximum distance of 500mm and 750mm, respectively, with a tenth of a millimeter accuracy. Therefore, it can rival the measurement range offered by the low-range draw-wire sensors, while providing superior accuracy and non-intrusivity to the process.

The introduction of the new ILD1910 laser sensor series directly replaced the ILD1750 sensors. Compared to its predecessor, the ILD1910 offers an enhanced measuring rate, linearity and sensitivity even at the higher end of the measuring range.

It is also our pleasure to announce the increase in manufacturing capability of the compact laser triangulation sensors (ILD1220, ILD1320 and ILD1420 series) to support the requirements of OEM suppliers. With the new production capacity of 50,000 units per year, we can ensure supply for large-scale projects and offer a better cost-benefit to our customers.

In addition, the ILD1x20 portfolio now offers double the measuring rate and increased protection class to IP67 for reliability to measure in an industrial environment. Users now also have access to the digital calibration report, which is stored in the sensor and can be downloaded from the web interface.

Finally, the new IMS5420 white light interferometry systems offer inline thickness measurements of monocrystalline silicon wafers from 0.05 to 1.05mm with superior signal stability, regardless of the distance from objects. This high-precision interferometer is also available as a multi-peak measuring system for thickness measurement applications on multi-layered materials.

For technical discussion, please contact one of our engineers here.