The Xi 1M is a rugged, short-wavelength thermal camera designed for non-contact temperature measurement of hot, low-emissivity materials such as metals, alloys, ceramics, and semiconductors. Operating in the 0.85–1.1 µm range, it minimizes errors from reflections and emissivity variations common in high-temperature environments.
It measures temperatures from 450 °C to 1800 °C without sub-range switching, using a 396 × 300 CMOS detector with 15 µm pixels. Full-frame images are captured at 20 Hz, while line scanning up to 500 Hz allows continuous temperature profiling of moving targets like metal strips or rotating parts. A motorized focus ensures sharp images at varying working distances.
The camera is housed in an IP67-rated stainless steel enclosure for industrial durability and offers Ethernet, USB 2.0, and RS-485 connectivity, with Power-over-Ethernet support and 8–30 V DC operation for easy integration. For automation, it provides analog and isolated inputs, with optional stackable process interfaces allowing up to nine independent outputs with fail-safe monitoring.
Autonomous operation enables internal temperature processing and hot-spot detection, with results delivered directly via analog, digital, or alarm outputs, making the Xi 1M a versatile solution for industrial temperature monitoring and process control.
Key Features:
- Small sized rugged camera with motorized focus
- Wide measurement range from 450 °C to 1800 °C without sub-ranges
- Highly dynamic CMOS detector with 396 x 300 pixels resolution
- Fast line scanning mode with 500 Hz
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